ViewTube

On this channel you will find information about specialized methods for surface analysis like inverse gas chromatography, Tof Sims, XPS and SEM.
Inverse gas chromatography is used to measure the surface energy of a material, while Tof-SIMS and XPS are used to analyze the chemical composition and electronic structure of a material's surface. Scanning electron microscopy (SEM) is commonly used to image the surface of a material at high resolution.
Inolytix's goal is to help companies improve their operational efficiency and reduce costs through the use of advanced data analytics technology.